Advanced Study Group Input Data and Validation (LWW)
Micro-shear deformation of pure copper
J. Pfetzing-Micklich, S. Brinckmann, S.J. Dey, F. Otto, A. Hartmaier, G. Eggeler.
Materialwissenschaft und Werkstofftechnik, 42, 219-223, (2011)
In this paper a new micro-shear experiment is introduced using a double shear specimen machined by a focused ion beam technique. The micro-shear specimen is structured from pure copper promoting (111)  slip. Comparing scanning electron microscopy images before and after deformation provides evidence for localized shear. Load-displacement data identify a load plateau and characterize the localized shear process (critical shear-stress for activation of (111)  slip: 170 MPa).
Keyword(s): shear deformation; slip system; nanoindentation; copper; focused ion beam machining