ICAMS / Interdisciplinary Centre for Advanced Materials Simulation
more conferences »

Events

Tracking nanoscale interfaces related mechanisms in materials using advanced transmission electron microscopy

Date: 06.11.2013
Time: 11:20 a.m.
Place: Materials Day 2013, Ruhr-Universität Bochum, Bochum, Germany

Hosni Idrissi, Department of Physics, University of Antwerp, Belgium

The present work will focus on the investigation of the elementary mechanisms controlling the formation and the evolution of various types of interfaces such as grain boundaries, phase boundaries and twin boundaries under mechanical loading. Special attention will be paid to the interaction of these boundaries with the elementary atomistic deformation and cracking mechanisms and the resulting mechanical properties involving the strength, ductility and creep of systems with a high density of interfaces organized at different scales. More precisely, the investigations were performed on 3D bulk materials and on small dimension systems in the form of thin films and micro/nanowires with a high density of interfaces. Materials with interfaces subjected to other types of solicitations such as irradiation, chemical diffusion of elements like H and thermal loading will be presented.

Advanced nanocharacterization and testing methods were used to unravel the elementary processes activated at the micro and nanoscale. It mainly relies on conventional, advanced high-resolution and nanoprobe electron microscopy techniques coupled with various ex-situ and in-situ micro and nanomechanical testing techniques. The practical outcomes consist in the development of predictive models and of improved processing routes as well as improved characterization methods towards the development of new materials with enhanced performances.

« back