ICAMS / Interdisciplinary Centre for Advanced Materials Simulation

Research Highlights

Effect of grain statistics on micromechanical modeling: the example of additively manufactured materials examined by electron backscatter diffraction

A. Biswas, M. Ramaswamy Guru Prasad, N. Vajragupta, A. Kostka, T. Niendorf, A. Hartmaier.

Micromechanical modeling is one of the prominent numerical tools for the prediction of mechanical properties and the understanding of deformation mechanisms of metals. As input parameters, it uses data obtained from microstructure characterization techniques, among which the electron backscatter diffraction (EBSD) technique allows us to understand the nature of microstructural features, that are usually described by statistics. Because of these advantages, the EBSD dataset is widely used for synthetic microstructure generation. However, for the statistical description of microstructural features, the population of input data must be considered. Preferably, the EBSD measurement area must be sufficiently large to cover an adequate number of grains. However, a comprehensive study of this measurement area with a crystal plasticity finite element method (CPFEM) framework is still missing although it would considerably facilitate information exchange between experimentalists and simulation experts. Herein, the influence of the EBSD measurement area and the number of grains on the statistical description of the microstructural features and studying the corresponding micromechanical simulation results for 316L stainless steel samples produced by selective laser melting is investigated.

Optimum EBSD size for reliable micromechancial modeling.