Time: 4:00 p.m.
Place: IC 04 408
Marion Bartsch, Deutsches Zentrum für Luft- und Raumfahrt e. V., Köln, Germany
Properties of materials with a complex microstructure depend on the properties and the arrangement of the microstructural constituents. The presentation will show exemplarily for some materials how to derive 3-dimensional microstructure data on different length scales for the generation of numerical models, suitable for finite element analyses. For different length scales two methods are utilized - non-destructive X-ray tomography in the range from mm to μm and combined sequential focused ion beam (FIB) ablation and scanning electron microscopy in the submicron range.