ICAMS / Interdisciplinary Centre for Advanced Materials Simulation
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Digital material microstructures by means of tomography for simulation models

Date: 01.03.2018
Time: 4:00 p.m.
Place: IC 04 408

Marion Bartsch, Deutsches Zentrum für Luft- und Raumfahrt e. V., Köln, Germany

Properties of materials with a complex microstructure depend on the properties and the arrangement of the microstructural constituents. The presentation will show exemplarily for some materials how to derive 3-dimensional microstructure data on different length scales for the generation of numerical models, suitable for finite element analyses. For different length scales two methods are utilized - non-destructive X-ray tomography in the range from mm to μm and combined sequential focused ion beam (FIB) ablation and scanning electron microscopy in the submicron range.

Supporting information:

Bartsch_Seminar_2018.pdf
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