ICAMS / Interdisciplinary Centre for Advanced Materials Simulation
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Quantitative measurements of grain boundary excess volume from HAADF-STEM micrographs

Y. Buranova, H. Rösner, S. V. Divinski, R. Imlau, G. Wilde.

Acta Materialia, 106, 367-373, (2016)

Abstract
A novel approach for quantitative measurements of grain boundary (GB) excess volume has been developed using correlative analytical transmission electron microscopy (TEM) and successfully demonstrated for several simulated symmetrical [100] tilt GB configurations as well as for the experimental case of an Al bicrystal containing a near Σ13 GB with an additional twist component. The reliability and precision of this new approach is analyzed and the limitations are discussed.


Keyword(s): Grain boundaries (GBs); Excess volume; Transmission electron microscopy (TEM); High angle annular dark field (HAADF); Electron energy loss spectroscopy (EELS)
DOI: 10.1016/j.actamat.2016.01.033
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