ICAMS / Interdisciplinary Centre for Advanced Materials Simulation


Molecular dynamics simulation of focused Ga ion beam induced nanoscale damage on silicon and its annealing recovery mechanism

Date: 22.06.2016
Time: 2:45 p.m.
Place: EMN 2016: Energy Materials and Nanotechnology, Prague, Czech Republic

Zongwei Xu
Fengzhou Fang
Yinjing Xiao
Tao Wang
Alexander Hartmaier

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