Events
Molecular dynamics simulation of focused Ga ion beam induced nanoscale damage on silicon and its annealing recovery mechanism
Date: 22.06.2016Time: 2:45 p.m.
Place: EMN 2016: Energy Materials and Nanotechnology, Prague, Czech Republic
Zongwei Xu
Fengzhou Fang
Yinjing Xiao
Tao Wang
Alexander Hartmaier
