ICAMS / Interdisciplinary Centre for Advanced Materials Simulation

Events

Using the new rotation vector base line electron back scatter diffraction (RVB-EBSD) method to characterize single crystal cast microstructures

Date: 24.02.2020
Place: TMS 2020, San Diego, USA

Pascal Thome
Bahareh Medghalchi
Gunther Eggeler
Jan Frenzel

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