Events
Using the new rotation vector base line electron back scatter diffraction (RVB-EBSD) method to characterize single crystal cast microstructures
Date: 17.03.2021Place: TMS 2021, online event
Pascal Thome
Felicitas Scholz, Ruhr-Universität Bochum, Bochum, Germany
Jan Frenzel
Gunther Eggeler
