Publications
Crack tip dislocations and its shielding effect
M. Tanaka, Y. Hoshino, A. Hartmaier, K. Higashida.
Materials Science Forum, 561-565, 1833-1836, (2008)
Abstract
Two dimensional simulations of discrete dislocation dynamics were carried out to clarify a
shielding effect due to dislocations at a crack tip. The configuration of dislocations around the crack
tip was calculated under the conditions of mode I tensile load at high temperatures. The stress field
around the crack tip due to dislocations was found to be compressive, accommodating mode I stress
intensity at the crack tip. In order to experimentally confirm the stress accommodation, infrared
photoelastic observation was also performed in a specimen pre-deformed at high temperatures. The
experimental result is in good agreement with a simulated infrared photoelastic image derived from
the stress field calculated.
Keyword(s): silicon, stress accommodation, dislocation dynamics, infrared photoelasticity
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